Nanoscale optical tomography using volume-scanning near-field microscopy
نویسندگان
چکیده
منابع مشابه
Nanoscale Optical Tomography using Volume-scanning Near-field Microscopy
microscopy Jin Sun, John C. Schotland, Rainer Hillenbrand, and P. Scott Carney Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, USA Department of Bioengineering and Graduate Group in Applied Mathematics and Computational Science, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA Nanooptics Laboratory, CIC nanoGUNE Consolider, 200...
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Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2009
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.3224177